XRD Testing

X-ray analyses of detailed crystallographic structures of crystals, powders, thin films, etc

 
 
 

Test Method:

XRD (X-ray Diffraction)

Equipment:

Bruker D8 Advance / Ultima IV

Applications:

• Crystallographic analyses

• Quantitative compositional analyses

• In situ observation of crystal phase changes at high temperature

Test Modes:

Normal Scanning:

• Scanning Mode: θ - 2θ

• 2θ Angle Range: 10° - 90° (or as required)


Grazing Incidence Diffraction (GID, GIXRD):

• Scanning Mode: α - 2θ

• α is the fixed incidence angle: 1° (or as required)

• 2θ Angle Range: 10° - 90° (or as required)


X-Ray Reflectivity (XRR):

• Analyses of film thickness, roughness, etc


High Temperature Scanning:

• Scanning Mode: θ - 2θ

• 2θ Angle Range: 10° - 90° (or as required)

• Substrate Temperature: RT - 2000 °C

Test Time:

• 7 Working Days

Useful Links:

XRD on Wikipedia

• GID / GIXRD on Wikipedia


Download XRD Enquiry Form