| Test Method: | Atomic Force Microscope (AFM)
|
Equipment: | Bruker Dimension Icon |
| Sample Size: | • Substrate > 5*5 mm, with flat surface
• Powder samples |
| Remarks: | • We provide multiple scannings for each sample, from different locations with different magnifications.
• Original data provided for data analysis, such as 3D structure, height profile, etc. |
Test Time:
| • 7 Working Days |
Useful Links: | • AFM on Wikipedia |
Free sample collection within Singapore!
Contact us now (sales@latech.com.sg) to arrange your testing slots!
